Tag: Optical Metrology

Optical Metrology

  • When Optics Met WaveMe

    When Optics Met WaveMe

    Much like “When Harry Met Sally”, discovering the depths of their relationship over time, integrating WaveMe into your lab toolbox is an evolving partnership that blossoms with investment and effort. At first maybe you noticed how simple and effortless WaveMe’s wavefront sensing was, but the real magic unfolds as you dive deeper, taking advantage of…

  • Shack-Hartmann Wavefront Sensor Calibration in WaveMe

    Shack-Hartmann Wavefront Sensor Calibration in WaveMe

    Calibration and Why it is Needed The WaveMe toolbox has a rather exceptional calibration method that allows for much more flexible use of the Shack-Hartmann wavefront sensor. This tech talk will be about what it is and why it is different from what is available elsewhere. We will assume that you, the reader, are already…

  • Designing a point diffraction interferometer

    Designing a point diffraction interferometer

    In this tech talk, we will dive a little deeper into the design of a point diffraction interferometer, or PDI for short. We have talked about it a little superficially in an earlier tech talk but this time, there should be enough for anybody who may consider building one. This application is well supported by…

  • Point Diffraction Interferometer

    Point Diffraction Interferometer

    The Smartt interferometer or its evolution, the Phase-shifting point diffraction interferometer is probably the most accurate one can make, and it is not even expensive. It has its limitation, doesn’t everything, such as that we need a focus to create a reference wave with a pinhole. If the focus is at a high numerical aperture,…

  • Wavefront Metrology

    Wavefront Metrology

    Optical wavefront metrology is a big subject. In this tech talk, we will focus on two topics which could even be considered dichotomies, phase-shifting interferometry and Shack-Hartmann wavefront metrology. With phase-shifting inteferometry, accuracy is key and every nanometer is significant. Speed and versatility comes second. Quite the opposite can be said for Shack-Hartmann wavefront metrology…